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DATE
2009
IEEE
125views Hardware» more  DATE 2009»
14 years 2 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
JOCN
2010
126views more  JOCN 2010»
13 years 6 months ago
Evidence for Early Morphological Decomposition in Visual Word Recognition
■ We employ a single-trial correlational MEG analysis technique to investigate early processing in the visual recognition of morphologically complex words. Three classes of affi...
Olla Solomyak, Alec Marantz
CVPR
2009
IEEE
15 years 2 months ago
Active Learning for Large Multi-class Problems
Scarcity and infeasibility of human supervision for large scale multi-class classification problems necessitates active learning. Unfortunately, existing active learning methods ...
Prateek Jain (University of Texas at Austin), Ashi...
ICCV
2005
IEEE
14 years 9 months ago
Creating Efficient Codebooks for Visual Recognition
Visual codebook based quantization of robust appearance descriptors extracted from local image patches is an effective means of capturing image statistics for texture analysis and...
Bill Triggs, Frédéric Jurie
SIGMOD
2008
ACM
140views Database» more  SIGMOD 2008»
14 years 7 months ago
Relational joins on graphics processors
We present a novel design and implementation of relational join algorithms for new-generation graphics processing units (GPUs). The most recent GPU features include support for wr...
Bingsheng He, Ke Yang, Rui Fang, Mian Lu, Naga K. ...