377 search results - page 21 / 76 » Effective TARO Pattern Generation |
ICCAD
1997
IEEE
13 years 12 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
GIS
2002
ACM
13 years 7 months ago
2002
ACM
Clustering is one of the most important tasks for geographic knowledge discovery. However, existing clustering methods have two severe drawbacks for this purpose. First, spatial c...
ICMCS
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper proposes a new animation editing method for creating animations from a single texture image. A standard warping method can not handle a physical motion effect because o...
TCAD
2008
13 years 7 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
IOLTS
2000
IEEE
14 years 1 days ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...