We address the problem of instruction selection for Multi-Output Instructions (MOIs), producing more than one result. Such inherently parallel hardware instructions are very commo...
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
Efficient routing and wavelength assignment (RWA) in wavelength-routed all-optical networks is critical for achieving high efficiency over the backbone links. Extensive research ha...
Background: The purpose of this manuscript is to provide, based on an extensive analysis of a proteomic data set, suggestions for proper statistical analysis for the discovery of ...
Mohammed Dakna, Keith Harris, Alexandros Kalousis,...
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...