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CODES
2007
IEEE
14 years 3 months ago
2007
IEEE
We address the problem of instruction selection for Multi-Output Instructions (MOIs), producing more than one result. Such inherently parallel hardware instructions are very commo...
DAC
2005
ACM
13 years 10 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
BROADNETS
2006
IEEE
14 years 16 days ago
2006
IEEE
Efficient routing and wavelength assignment (RWA) in wavelength-routed all-optical networks is critical for achieving high efficiency over the backbone links. Extensive research ha...
BMCBI
2010
13 years 6 months ago
2010
Background: The purpose of this manuscript is to provide, based on an extensive analysis of a proteomic data set, suggestions for proper statistical analysis for the discovery of ...
ICES
2000
Springer
14 years 12 days ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...