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» Efficient Embedding of Deterministic Test Data
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SODA
2010
ACM
169views Algorithms» more  SODA 2010»
14 years 4 months ago
Efficiently Decodable Non-adaptive Group Testing
We consider the following "efficiently decodable" nonadaptive group testing problem. There is an unknown string x {0, 1}n with at most d ones in it. We are allowed to t...
Piotr Indyk, Hung Q. Ngo, Atri Rudra
VTS
2005
IEEE
102views Hardware» more  VTS 2005»
14 years 6 days ago
An Efficient Random Jitter Measurement Technique Using Fast Comparator Sampling
This paper describes a random jitter measurement technique using simple algorithms and comparator sampling. The approach facilitates using Automated Test Equipment (ATE) to valida...
Dongwoo Hong, Cameron Dryden, Gordon Saksena
ITC
1996
IEEE
127views Hardware» more  ITC 1996»
13 years 10 months ago
Altering a Pseudo-Random Bit Sequence for Scan-Based BIST
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
Nur A. Touba, Edward J. McCluskey
IJIT
2004
13 years 8 months ago
A System for Performance Evaluation of Embedded Software
Developers need to evaluate software's performance to make software efficient. This paper suggests a performance evaluation system for embedded software. The suggested system ...
Yong-Yoon Cho, Jong-Bae Moon, Young-Chul Kim
CORR
2010
Springer
152views Education» more  CORR 2010»
13 years 4 months ago
Evolutionary Approach to Test Generation for Functional BIST
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...
Y. A. Skobtsov, D. E. Ivanov, V. Y. Skobtsov, Raim...