31 search results - page 4 / 7 » Efficient Hardware for Antialiasing Coverage Mask Generation |
ATS
1996
IEEE
13 years 12 months ago
1996
IEEE
A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from t...
ATS
2002
IEEE
14 years 20 days ago
2002
IEEE
In this paper, we present a technique for reducing the test length of counter-based pseudo-exhaustive built-in self-testing (BIST) based on width compression method. More formally...
ATS
2004
IEEE
13 years 11 months ago
2004
IEEE
In this paper, we propose a low-power testing methodology for the scan-based BIST. A smoother is included in the test pattern generator (TPG) to reduce average power consumption d...
ETS
2006
IEEE
13 years 11 months ago
2006
IEEE
Online repair through reconfiguration is a particularly advantageous approach in the nanoelectronic environment since reconfigurability is naturally supported by the devices. Howe...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
– We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and cro...