192 search results - page 3 / 39 » Efficient Hierarchical Approach to Test Generation for Digit... |
DATE
1997
IEEE
13 years 11 months ago
1997
IEEE
This paper describes a practical test approach for analog-to-digital converters (ADCs) based on the oscillation-test strategy. The oscillation-test is applied to convert the ADC u...
CORR
2010
Springer
13 years 4 months ago
2010
Springer
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...
SEKE
2010
Springer
13 years 5 months ago
2010
Springer
—The behavior of complex production automation systems is hard to predict, therefore simulation is used to study the likely system behavior. However, in a real-world system many ...
DELTA
2008
IEEE
14 years 2 months ago
2008
IEEE
Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self tes...
IFIP
2001
Springer
13 years 12 months ago
2001
Springer
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...