173 search results - page 15 / 35 » Efficient Test Data Generation for Variables with Complex De... |
CASES
2007
ACM
13 years 11 months ago
2007
ACM
Advances in semiconductor technologies have placed MPSoCs center stage as a standard architecture for embedded applications of ever increasing complexity. Efficient utilization of...
CP
2007
Springer
13 years 11 months ago
2007
Springer
Abstract. Computing the minimal network (or minimal CSP) representation of a given set of constraints over the Point Algebra (PA) is a fundamental reasoning problem. In this paper ...
SDM
2009
SIAM
14 years 4 months ago
2009
SIAM
Automotive companies are forced to continuously extend and improve their product line-up. However, increasing diversity, higher design complexity, and shorter development cycles c...
CONSTRAINTS
2007
13 years 7 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
ESEM
2007
ACM
13 years 11 months ago
2007
ACM
Comprehension errors in software design must be detected at their origin to avoid propagation into later portions of the software lifecycle and also the final system. This researc...