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DFT
2004
IEEE
94views VLSI» more  DFT 2004»
14 years 1 months ago
Response Compaction for Test Time and Test Pins Reduction Based on Advanced Convolutional Codes
This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output encoder based on check matrix of a (n, n1, m, 3) convolutional...
Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman ...
TCAD
2002
73views more  TCAD 2002»
13 years 9 months ago
System-on-a-chip test scheduling with precedence relationships, preemption, and power constraints
Test scheduling is an important problem in system-on-a-chip (SOC) test automation. Efficient test schedules minimize the overall system test application time, avoid test resource c...
Vikram Iyengar, Krishnendu Chakrabarty
PERVASIVE
2010
Springer
13 years 11 months ago
Supporting Energy-Efficient Uploading Strategies for Continuous Sensing Applications on Mobile Phones
Abstract. Continuous sensing applications (e.g., mobile social networking applications) are appearing on new sensor-enabled mobile phones such as the Apple iPhone, Nokia and Androi...
Mirco Musolesi, Mattia Piraccini, Kristof Fodor, A...
SE
2010
13 years 11 months ago
Multi-Level Test Models for Embedded Systems
Abstract: Test methodologies for large embedded systems fail to reflect the test process as a whole. Instead, the test process is divided into independent test levels feaifferences...
Abel Marrero Pérez, Stefan Kaiser
SE
2008
13 years 11 months ago
A TTCN-3-based Web Service Test Framework
: The increased usage of Web services for critical applications introduces a growing need for efficient testing approaches to assure their quality. The Testing and Test Control Not...
Edith Werner, Jens Grabowski, Stefan Troschüt...