2174 search results - page 40 / 435 » Efficient Testing of Forecasts |
TCAD
2008
13 years 9 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
EDM
2010
13 years 8 months ago
2010
Dynamic assessment (DA) has been advocated as an interactive approach to conduct assessments to students in the learning systems as it can differentiate student proficiency at a fi...
ATS
2002
IEEE
14 years 2 months ago
2002
IEEE
In this paper, we present a technique for reducing the test length of counter-based pseudo-exhaustive built-in self-testing (BIST) based on width compression method. More formally...
DSD
2010
IEEE
13 years 8 months ago
2010
IEEE
— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...
MOBISYS
2004
ACM
14 years 9 months ago
2004
ACM
Computation off-loading, i.e., remote execution, has been shown to be effective for extending the computational power and battery life of resource-restricted devices, e.g., hand-h...