Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
Abstract. This paper studies a risk minimization approach to estimate a transformation model from noisy observations. It is argued that transformation models are a natural candidat...
Vanya Van Belle, Kristiaan Pelckmans, Johan A. K. ...
We consider reinforcement learning in the parameterized setup, where the model is known to belong to a parameterized family of Markov Decision Processes (MDPs). We further impose ...
Based on rank-1 update, Sparse Bayesian Learning Algorithm (SBLA) is proposed. SBLA has the advantages of low complexity and high sparseness, being very suitable for large scale pr...