71 search results - page 8 / 15 » Efficient probe selection algorithms for fault diagnosis |
IMC
2010
ACM
13 years 5 months ago
2010
ACM
Current large-scale topology mapping systems require multiple days to characterize the Internet due to the large amount of probing traffic they incur. The accuracy of maps from ex...
ITC
2003
IEEE
14 years 22 days ago
2003
IEEE
We present an efficient algorithm for identification of two-line bridges in combinational CMOS logic that narrows down the two-line bridge candidates based on tester responses for...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
ICSE
2012
IEEE-ACM
11 years 9 months ago
2012
IEEE-ACM
—This paper describes a new technique, which automatically selects the most appropriate developers for fixing the fault represented by a failing test case, and provides a diagno...
ECAI
2004
Springer
14 years 26 days ago
2004
Springer
Recent years have seen considerable developments in modeling techniques for automatic fault location in programs. However, much of this research considered the models from a standa...