127 search results - page 13 / 26 » Efficiently generating test vectors with state pruning |
SNPD
2008
13 years 9 months ago
2008
This paper focuses on studying efficient solutions for modeling and deriving compositional tests for component-based real-time systems. In this work, we propose a coherent framewo...
CONSTRAINTS
2007
13 years 7 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
CVPR
2009
IEEE
15 years 2 months ago
2009
IEEE
Support Vector Machines (SVM) are one of the most useful
techniques in classification problems. One clear example
is face recognition. However, SVM cannot be applied
when the fe...
ICPR
2004
IEEE
14 years 8 months ago
2004
IEEE
In this paper, we present a novel maximum correlation sample subspace method and apply it to human face detection [1] in still images. The algorithm starts by projecting all the t...
CSREAESA
2008
13 years 9 months ago
2008
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...