127 search results - page 14 / 26 » Efficiently generating test vectors with state pruning |
DAC
1997
ACM
13 years 11 months ago
1997
ACM
The biggest obstacle in the formal verification of large designs is their very large state spaces, which cannot be handled even by techniques such as implicit state space travers...
ET
2010
13 years 5 months ago
2010
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
CCS
2009
ACM
14 years 2 months ago
2009
ACM
A power grid is a complex system connecting electric power generators to consumers through power transmission and distribution networks across a large geographical area. System mo...
SDM
2008
SIAM
13 years 9 months ago
2008
SIAM
Graph data such as chemical compounds and XML documents are getting more common in many application domains. A main difficulty of graph data processing lies in the intrinsic high ...
ET
2002
13 years 7 months ago
2002
In this paper we present a new reseeding technique for test-per-clock test pattern generation suitable for at-speed testing of circuits with random-pattern resistant faults. Our te...