1551 search results - page 29 / 311 » Elastic Vector Time |
DFT
2002
IEEE
14 years 1 months ago
2002
IEEE
Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...
SIGMOD
2012
ACM
11 years 11 months ago
2012
ACM
Cloud enabled systems have become a crucial component to efficiently process and analyze massive amounts of data. One of the key data processing and analysis operations is the Sim...
ADBIS
2009
Springer
14 years 3 months ago
2009
Springer
The inefficiency of integration processes—as an abstraction of workflow-based integration tasks—is often reasoned by low resource utilization and significant waiting times f...
DATE
2003
IEEE
14 years 1 months ago
2003
IEEE
We propose a technique for compressing test vectors. The technique reduces test application time and tester memory requirements by utilizing part of the predecessor response in co...
SODA
2010
ACM
14 years 5 months ago
2010
ACM
We present a simple and practical algorithm for the c-approximate near neighbor problem (c-NN): given n points P Rd and radius R, build a data structure which, given q Rd , can ...