116 search results - page 3 / 24 » Electromigration-Aware Physical Design of Integrated Circuit... |
120
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CHINAF
2006
15 years 4 months ago
2006
: With soaring work frequency and decreasing feature sizes, VLSI circuits with RLC parasitic components are more like analog circuits and should be carefully analyzed in physical d...
121
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GLVLSI
2009
IEEE
2009
IEEE
On the complexity of graph cuboidal dual problems for 3-D floorplanning of integrated circuit design
15 years 11 months ago
This paper discusses the impact of migrating from 2-D to 3-D on floorplanning and placement. By looking at a basic formulation of graph cuboidal dual problem, we show that the 3-...
142
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DAC
2005
ACM
15 years 6 months ago
2005
ACM
A physical yet compact gate delay model is developed integrating short-channel effects and the Alpha-power law based timing model. This analytical approach accurately predicts bot...
158
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ICCD
2004
IEEE
16 years 1 months ago
2004
IEEE
Research in high-speed interconnect requires physical test to validate circuit models and design assumptions. At multi-Gbit/sec rates, physical implementations require custom circ...