257 search results - page 42 / 52 » Electronic circuit reliability modeling |
HASE
2008
IEEE
14 years 4 months ago
2008
IEEE
With the increasing complexity in software and electronics in safety-critical systems new challenges to lower the costs and decrease time-to-market, while preserving high assuranc...
VTC
2010
IEEE
13 years 8 months ago
2010
IEEE
Abstract—It is widely recognized that differential decode-andforward (DDF) cooperative transmission scheme is capable of providing a superior performance compared to classic dire...
OOPSLA
2004
Springer
14 years 3 months ago
2004
Springer
Radio Frequency Identification (RFID) technology provides the means to track any object, any time, anywhere with Electronic Product Codes (EPC). A major consequence of this techno...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
GLVLSI
2007
IEEE
13 years 11 months ago
2007
IEEE
We present a vector selection methodology for estimating the peak power dissipation in a CMOS logic circuit. The ultimate goal is to combine the speed of RT-level simulation with ...