Spatially distributed 3D circuit models are extracted with a segmentto-segment BEM (Boundary Element Method) algorithm for both capacitance and inverse inductance couplings rather...
Michael W. Beattie, Hui Zheng, Anirudh Devgan, Byr...
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...