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DFT
2006
IEEE
14 years 4 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
IPPS
2006
IEEE
14 years 4 months ago
2006
IEEE
Traditional code optimizers have produced significant performance improvements over the past forty years. While promising avenues of research still exist, traditional static and p...
TAICPART
2006
IEEE
14 years 4 months ago
2006
IEEE
One of the key roles of any information system is to enforce the business rules and policies set by the owning organisation. As for any important functionality, it is necessary to...
ASPLOS
2006
ACM
14 years 4 months ago
2006
ACM
Redundant threading architectures duplicate all instructions to detect and possibly recover from transient faults. Several lighter weight Partial Redundant Threading (PRT) archite...
ASPLOS
2006
ACM
14 years 4 months ago
2006
ACM
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...