56 search results - page 4 / 12 » Enhancing test efficiency for delay fault testing using mult... |
TCAD
2008
13 years 7 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
ATS
2004
IEEE
13 years 11 months ago
2004
IEEE
An efficient design for test methodology to increase the test yield of analog circuits is presented. It is assumed that the analog circuits are tested using alternate tests that r...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
– We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and cro...
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...
SIGPLAN
2002
13 years 7 months ago
2002
: Object-oriented frameworks require thorough testing as they are intended to be reused repeatedly in developing numerous applications. Moreover, whenever a framework is extended f...