1104 search results - page 36 / 221 » Ensemble classification based on generalized additive models |
EVOW
2008
Springer
13 years 10 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
ISBI
2004
IEEE
14 years 9 months ago
2004
IEEE
A general framework for performing robust, unsupervised tissue classification in magnetic resonance images is presented. Tissue classification is formulated as an estimation probl...
ICIP
2007
IEEE
14 years 10 months ago
2007
IEEE
Abstract - The proposed algorithm in this work provides superresolution for color images by using a learning based technique that utilizes both generative and discriminant approach...
AI
2002
Springer
13 years 8 months ago
2002
Springer
Most classification algorithms are "passive", in that they assign a class label to each instance based only on the description given, even if that description is incompl...
UAI
2008
13 years 10 months ago
2008
Inference problems in graphical models can be represented as a constrained optimization of a free energy function. It is known that when the Bethe free energy is used, the fixedpo...