Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
A general framework for performing robust, unsupervised tissue classification in magnetic resonance images is presented. Tissue classification is formulated as an estimation probl...
Abstract - The proposed algorithm in this work provides superresolution for color images by using a learning based technique that utilizes both generative and discriminant approach...
Most classification algorithms are "passive", in that they assign a class label to each instance based only on the description given, even if that description is incompl...
Inference problems in graphical models can be represented as a constrained optimization of a free energy function. It is known that when the Bethe free energy is used, the fixedpo...