The study of Multiple Soft errors on memory modules caused by radiation effects represents an interesting field of current research. The fault tolerance of these devices in radiati...
Pilar Reyes, Pedro Reviriego, Juan Antonio Maestro...
By storing more than one bit in each memory cell, multi-level per cell (MLC) NAND flash memories are dominating global flash memory market due to their appealing storage density ad...
Associative memory in cortical circuits has been held as a major mechanism for content-addressable memory. Hebbian synapses implement associative memory efficiently when storing s...
A study of Google’s data center revealed that the incidence of main memory errors is surprisingly high. These errors can lead to application and system corruption, impacting reli...
—The number of CPUs in chip multiprocessors is growing at the Moore’s Law rate, due to continued technology advances. However, new technologies pose serious reliability challen...