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ITC
1998
IEEE
174views Hardware» more  ITC 1998»
14 years 3 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
CGO
2007
IEEE
14 years 5 months ago
Run-Time Support for Optimizations Based on Escape Analysis
The JavaTM programming language does not allow the programmer to influence memory management. An object is usually allocated on the heap and deallocated by the garbage collector ...
Thomas Kotzmann, Hanspeter Mössenböck
SCAM
2005
IEEE
14 years 4 months ago
Static Analysis for Computing Escapability and Mutability for Java Components
A common theme in information security is protection of trusted software components against unauthorized access by untrusted users. In the context of distributed object technologi...
Aiwu Shi, Gleb Naumovich
ECOOP
2004
Springer
14 years 4 months ago
Efficiently Verifiable Escape Analysis
Matthew Q. Beers, Christian Stork, Michael Franz