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» Estimating the Number of Residual Defects
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DSD
2007
IEEE
132views Hardware» more  DSD 2007»
14 years 1 months ago
On-Chip Cache Device Scaling Limits and Effective Fault Repair Techniques in Future Nanoscale Technology
In this study, we investigate different cache fault tolerance techniques to determine which will be most effective when on-chip memory cell defect probabilities exceed those of cu...
David Roberts, Nam Sung Kim, Trevor N. Mudge
BMCBI
2008
87views more  BMCBI 2008»
13 years 10 months ago
Identification of deleterious non-synonymous single nucleotide polymorphisms using sequence-derived information
Background: As the number of non-synonymous single nucleotide polymorphisms (nsSNPs), also known as single amino acid polymorphisms (SAPs), increases rapidly, computational method...
Jing Hu, Changhui Yan
BMCBI
2006
103views more  BMCBI 2006»
13 years 9 months ago
Domain-based small molecule binding site annotation
Background: Accurate small molecule binding site information for a protein can facilitate studies in drug docking, drug discovery and function prediction, but small molecule bindi...
Kevin A. Snyder, Howard J. Feldman, Michel Dumonti...
ISBI
2006
IEEE
14 years 10 months ago
Iterative finite element deformable model for nonrigid coregistration of multimodal breast images
We have developed a nonrigid registration technique applicable to breast tissue imaging. It relies on a finite element method (FEM) model and a set of fiducial skin markers (FSMs)...
Alphonso Magri, Andrzej Król, David H. Feig...
ICCAD
2004
IEEE
107views Hardware» more  ICCAD 2004»
14 years 6 months ago
Computation of signal threshold crossing times directly from higher order moments
—This paper introduces a simple method for calculating the times at which any signal crosses a prespecified threshold voltage (e.g., 10%, 20%, 50%, etc.) directly from the moment...
Yehea I. Ismail, Chirayu S. Amin