2348 search results - page 128 / 470 » Evaluation Patterns of Tele-Haptics |
VTS
2008
IEEE
14 years 3 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
ICMCS
2007
IEEE
14 years 3 months ago
2007
IEEE
We propose a discriminative learning approach for fusing multichannel sequential data with application to detect unsafe driving patterns from multi-channel driving recording data....
PERVASIVE
2007
Springer
14 years 3 months ago
2007
Springer
While commercial solutions for precise indoor positioning exist, they are costly and require installation of additional infrastructure, which limits opportunities for widespread ad...
WACV
2005
IEEE
14 years 2 months ago
2005
IEEE
We address the problem of clustering of contour images from hardware tools based on string descriptions, in a comparative study of cluster combination techniques. Several clusteri...
DEXA
2005
Springer
14 years 2 months ago
2005
Springer
Finding all the occurrences of a twig pattern in an XML database is a core operation for efficient evaluation of XML queries. Holistic twig join algorithm has showed its superiorit...