469 search results - page 12 / 94 » Evolutionary Approach to Test Generation for Functional BIST |
GECCO
2006
Springer
13 years 11 months ago
2006
Springer
1 Learnable Evolution Model (LEM) is a form of non-Darwinian evolutionary computation that employs machine learning to guide evolutionary processes. Its main novelty are new type o...
TCAD
2002
13 years 7 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
GECCO
2004
Springer
14 years 1 months ago
2004
Springer
The method of evolutionary functional testing allows for the automation of testing by transforming test case design into an optimization problem. To this end it is necessary to def...
VTS
2002
IEEE
14 years 17 days ago
2002
IEEE
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
ICARIS
2007
Springer
14 years 1 months ago
2007
Springer
We present an Immune Inspired Algorithm, based on CLONALG, for software test data evolution. Generated tests are evaluated using the mutation testing adequacy criteria, and used to...