4540 search results - page 150 / 908 » Evolving the |
ICES
2007
Springer
14 years 3 days ago
2007
Springer
Abstract. Fault Tolerance is an increasing challenge for integrated circuits due to semiconductor technology scaling. This paper looks at how artificial evolution may be tuned to ...
EVOW
2008
Springer
14 years 3 days ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
IE
2007
13 years 12 months ago
2007
Images are widely used in media contexts such as web design, games and video animation. The process of creating interesting images can be enjoyable if a useful tool is involved. I...
FOAL
2008
ACM
13 years 12 months ago
2008
ACM
AAAI
2010
13 years 11 months ago
2010
As computer architectures become increasingly complex, hand-tuning compiler heuristics becomes increasingly tedious and time consuming for compiler developers. This paper presents...