770 search results - page 104 / 154 » Experiences with teaching design patterns |
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
ICCS
2001
Springer
14 years 1 months ago
2001
Springer
Abstract. Parallel Computational Science and Engineering (CSE) applications often exhibit irregular structure and dynamic load patterns. Many such applications have been developed ...
ISRR
2001
Springer
14 years 1 months ago
2001
Springer
We demonstrate an adaptation strategy for adjusting the stride period in a hexapedal running robot. The robot is inspired by discoveries about the self-stabilizing properties of i...
ATS
2000
IEEE
14 years 1 months ago
2000
IEEE
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...
CHI
2000
ACM
14 years 1 months ago
2000
ACM
This paper provides a unique quantitative analysis of the social dynamics of three chat rooms in the Microsoft VChat graphical chat system. Survey and behavioral data were used to...