— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
Dynamic voltage scaling and sleep state control have been shown to be extremely effective in reducing energy consumption in CMOS circuits. Though plenty of research papers have st...
Razvan Racu, Arne Hamann, Rolf Ernst, Bren Mochock...
Regression testing is often performed with a time budget and it does not allow executing all test cases. Test case prioritization techniques re-order test cases to increase the ra...
Dongjiang You, Zhenyu Chen, Baowen Xu, Bin Luo, Ch...