87 search results - page 13 / 18 » Exploiting Instruction Redundancy for Transient Fault Tolera... |
IPPS
2006
IEEE
14 years 1 months ago
2006
IEEE
The performance requirements for contemporary microprocessors are increasing as rapidly as their number of applications grows. By accelerating the clock, performance can be gained...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
Device and interconnect fabrics at the nanoscale will have a density of defects and susceptibility to transient faults far exceeding those of current silicon technologies. In this...
ETS
2006
IEEE
13 years 11 months ago
2006
IEEE
Online repair through reconfiguration is a particularly advantageous approach in the nanoelectronic environment since reconfigurability is naturally supported by the devices. Howe...
HPCA
2008
IEEE
14 years 7 months ago
2008
IEEE
The continued scaling of device dimensions and the operating voltage reduces the critical charge and thus natural noise tolerance level of transistors. As a result, circuits can p...
ISCA
2012
IEEE
11 years 10 months ago
2012
IEEE
The reliability of future processors is threatened by decreasing transistor robustness. Current architectures focus on delivering high performance at low cost; lifetime device rel...