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Exploiting Logic Simulation to Improve Simulation-based Sequ...
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1997
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Exploiting Logic Simulation to Improve Simulation-based Sequential ATPG
14 years 3 months ago
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Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
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MTV
2007
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Reduction of Power Dissipation during Scan Testing by Test Vector Ordering
14 years 5 months ago
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Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
Wang-Dauh Tseng, Lung-Jen Lee
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