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ATS
1997
IEEE
90views Hardware» more  ATS 1997»
13 years 11 months ago
Exploiting Logic Simulation to Improve Simulation-based Sequential ATPG
Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
MTV
2007
IEEE
118views Hardware» more  MTV 2007»
14 years 1 months ago
Reduction of Power Dissipation during Scan Testing by Test Vector Ordering
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
Wang-Dauh Tseng, Lung-Jen Lee