—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
Developing mechanisms for the efficient exchange of information between simulations and other manufacturing tools is a critical problem. For many areas of manufacturing, neither r...
This paper concerns the use of static analysis for debugging purposes of declarative object-oriented equation-based modeling languages. We propose a framework where over- and unde...
- Computer component fabrication is approaching physical limits of traditional photolithographic fabrication techniques. An alternative computer architecture may be enabled by the ...
As CDMA systems reach capacity, infrastructure providers are extending them by offering multicarrier capability. The capacity of an n-carrier CDMA system should be at least n time...