604 search results - page 31 / 121 » Failure Mechanisms in MEMS |
DAC
1996
ACM
14 years 3 days ago
1996
ACM
Hot-carrier eects and electromigration are the two important failure mechanisms that signi cantly impact the long-term reliability of high-density VLSI ICs. In this paper, we prese...
SIGSOFT
2007
ACM
2007
ACM
Fault and adversary tolerance as an emergent property of distributed systems' software architectures
14 years 8 months ago
Fault and adversary tolerance have become not only desirable but required properties of software systems because mission-critical systems are commonly distributed on large network...
IPPS
2007
IEEE
14 years 2 months ago
2007
IEEE
As the size and popularity of computer clusters go on growing, fault tolerance is becoming a crucial factor to ensure high performance and reliability for applications. To provide...
OTM
2007
Springer
14 years 2 months ago
2007
Springer
The number of processors embedded in high performance computing platforms is growing daily to solve larger and more complex problems. However, as the number of components increases...
EDCC
1999
Springer
14 years 7 days ago
1999
Springer
The paper focuses on the problem to guarantee reliable and ordered message delivery to the operational sites of a CAN-Bus network. The contributions of the paper are firstly a hard...