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IOLTS
2006
IEEE
101views Hardware» more  IOLTS 2006»
14 years 2 months ago
Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
Swaroop Ghosh, Swarup Bhunia, Arijit Raychowdhury,...
NOSSDAV
2005
Springer
14 years 1 months ago
1-800-OVERLAYS: using overlay networks to improve VoIP quality
The cost savings and novel features associated with Voice over IP (VoIP) are driving its adoption by service providers. Such a transition however can successfully happen only if t...
Yair Amir, Claudiu Danilov, Stuart Goose, David He...
DSN
2002
IEEE
14 years 1 months ago
Distributed Object Middleware to Support Dependable Information Sharing between Organisations
Organisations increasingly use the Internet to offer their own services and to utilise the services of others. This naturally leads to information sharing across organisational bo...
Nick Cook, Santosh K. Shrivastava, Stuart M. Wheat...
SRDS
1999
IEEE
14 years 9 days ago
An Adaptive Checkpointing Protocol to Bound Recovery Time with Message Logging
Numerous mathematical approaches have been proposed to determine the optimal checkpoint interval for minimizing total execution time of an application in the presence of failures....
Kuo-Feng Ssu, Bin Yao, W. Kent Fuchs
ATAL
2006
Springer
13 years 11 months ago
Adaptive distributed resource allocation and diagnostics using cooperative information-sharing strategies
A major challenge in efficiently solving distributed resource allocation problems is to cope with the dynamic state changes that characterise such systems. An effective solution t...
Partha Sarathi Dutta, Nicholas R. Jennings, Luc Mo...