A critical step in defect detection for semiconductorprocess is to align a test image against a reference. This includes both spatial alignment and grayscale alignment. For the la...
In this paper we present a novel view point independent range image segmentation and recognition approach. We generate a library of 3D models off-line and represent each model wit...
In this paper, a novel method for simultaneously registering multiple images acquired from different imaging modalities is presented. The optimal alignment is computed as the set ...
This paper presents a powerful variant of the ICP (Iterative Closest Point) algorithm for registering range images using a probability field. The probability field (p-field) repre...
This paper describes a probabilistic method of aligning and merging range images. We formulate these issues as problems of estimating the maximum likelihood. By examining the erro...