980 search results - page 27 / 196 » Faster Possibility Detection by Combining Two Approaches |
118
Voted
ITC
2003
IEEE
15 years 9 months ago
2003
IEEE
Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) r...
126
Voted
KDD
2005
ACM
15 years 10 months ago
2005
ACM
Data clustering represents an important tool in exploratory data analysis. The lack of objective criteria render model selection as well as the identification of robust solutions...
170
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WWW
2001
ACM
16 years 5 months ago
2001
ACM
The term "application profile" has recently become highly topical. Heery and Patel [1] define application profiles as metadata schemas which consist of metadata elements...
146
Voted
BMCBI
2008
15 years 4 months ago
2008
Background: Many programs have been developed to identify transcription factor binding sites. However, most of them are not able to infer two-word motifs with variable spacer leng...
172
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BMCBI
2010
15 years 4 months ago
2010
Background: It is well known that most of the binding free energy of protein interaction is contributed by a few key hot spot residues. These residues are crucial for understandin...