414 search results - page 17 / 83 » Fault Detection Effectiveness of Spathic Test Data |
ET
2007
13 years 8 months ago
2007
In this paper, we present an exhaustive study on the influence of resistive-open defects in pre-charge circuits of SRAM memories. In SRAM memories, the pre-charge circuits operate...
EURODAC
1995
IEEE
14 years 10 days ago
1995
IEEE
This paper presents a formal approach to test combinational circuits. For the sake of explanation we describe the basic algorithms with the help of the stuck–at fault model. Ple...
SIGPLAN
2002
13 years 8 months ago
2002
: Object-oriented frameworks require thorough testing as they are intended to be reused repeatedly in developing numerous applications. Moreover, whenever a framework is extended f...
VTS
1997
IEEE
14 years 1 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
ITC
1996
IEEE
14 years 29 days ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...