414 search results - page 37 / 83 » Fault Detection Effectiveness of Spathic Test Data |
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
This paper presents a case-study of delay defect screening applied to Fujitsu 2.16GHz SPARC64 microprocessor. A nonrobust delay test is used while each test vector is compacted to...
DAC
1997
ACM
13 years 12 months ago
1997
ACM
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
SRDS
2008
IEEE
14 years 2 months ago
2008
IEEE
Firewalls are the mainstay of enterprise security and the most widely adopted technology for protecting private networks. As the quality of protection provided by a firewall dire...
IOLTS
2008
IEEE
14 years 2 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
ICML
2005
IEEE
14 years 8 months ago
2005
IEEE
In a data streaming setting, data points are observed one by one. The concepts to be learned from the data points may change infinitely often as the data is streaming. In this pap...