414 search results - page 46 / 83 » Fault Detection Effectiveness of Spathic Test Data |
ASPLOS
2000
ACM
14 years 1 days ago
2000
ACM
Processors execute the full dynamic instruction stream to arrive at the final output of a program, yet there exist shorter instruction streams that produce the same overall effec...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper pre...
CCS
2008
ACM
13 years 9 months ago
2008
ACM
It is generally believed that by combining several diverse intrusion detectors (i.e., forming an IDS ensemble), we may achieve better performance. However, there has been very lit...
PLDI
2005
ACM
14 years 1 months ago
2005
ACM
Faults that occur in production systems are the most important faults to fix, but most production systems lack the debugging facilities present in development environments. TraceB...
CASES
2006
ACM
13 years 11 months ago
2006
ACM
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...