We investigate a characterization of hard-to-detect bridging faults. For circuits with large numbers of lines (or nodes), this characterization can be used to select target faults...
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
Jerry M. Soden, R. Keith Treece, Michael R. Taylor...
Test suite reduction uses test requirement coverage to determine if the reduced test suite maintains the original suite’s requirement coverage. Based on observations from our pr...
Sreedevi Sampath, Sara Sprenkle, Emily Gibson, Lor...
Partition testing is a well-known software testing technique. This paper shows that partition testing strategies are relatively ineffective in detecting faults related to small sh...
The origin of the study described here is the experiment performed by Basili and Selby, further replicated by Kamsties and Lott, and once again by Wood et al. These experiments inv...