414 search results - page 6 / 83 » Fault Detection Effectiveness of Spathic Test Data |
DATE
2003
IEEE
14 years 2 months ago
2003
IEEE
We investigate a characterization of hard-to-detect bridging faults. For circuits with large numbers of lines (or nodes), this characterization can be used to select target faults...
ITC
1989
IEEE
14 years 24 days ago
1989
IEEE
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
ISSRE
2006
IEEE
14 years 2 months ago
2006
IEEE
Test suite reduction uses test requirement coverage to determine if the reduced test suite maintains the original suite’s requirement coverage. Based on observations from our pr...
ISSRE
2003
IEEE
14 years 2 months ago
2003
IEEE
Partition testing is a well-known software testing technique. This paper shows that partition testing strategies are relatively ineffective in detecting faults related to small sh...
ESERNET
2003
Springer
14 years 2 months ago
2003
Springer
The origin of the study described here is the experiment performed by Basili and Selby, further replicated by Kamsties and Lott, and once again by Wood et al. These experiments inv...