87 search results - page 4 / 18 » Fault Diagnosis Using Timed Automata |
IEEEARES
2006
IEEE
14 years 1 months ago
2006
IEEE
There is an increasing demand for highly reliable systems in the safety conscious climate of today’s world. When a fault does occur there are two desirable outcomes. Firstly, de...
ICRA
2007
IEEE
14 years 2 months ago
2007
IEEE
— This paper extends the notion of residuals for fault detection, well known in the continuous system to the timed discrete events systems. The aim is to design the fault indicat...
ITC
2003
IEEE
14 years 29 days ago
2003
IEEE
Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) r...
ATS
2002
IEEE
14 years 20 days ago
2002
IEEE
This paper addresses the problem of locating the stuckopen faults in a manufactured IC with scan flip-flops. Unlike most previous methods that only aim at identifying the faulty s...
DFT
2002
IEEE
14 years 20 days ago
2002
IEEE
We propose an algorithm for gate-delay fault diagnosis. It is based on the inject-and-evaluate paradigm [1], in which the fault site(s) are predicted through a series of injection...