129 search results - page 22 / 26 » Fault Diagnosis with Dynamic Observers |
ASPLOS
2010
ACM
14 years 2 months ago
2010
ACM
Data center power infrastructure incurs massive capital costs, which typically exceed energy costs over the life of the facility. To squeeze maximum value from the infrastructure,...
ICSE
2003
IEEE-ACM
14 years 7 months ago
2003
IEEE-ACM
g Test Suites via Operational Abstraction Michael Harder Jeff Mellen Michael D. Ernst MIT Lab for Computer Science 200 Technology Square Cambridge, MA 02139 USA {mharder,jeffm,mern...
ISPASS
2010
IEEE
14 years 2 months ago
2010
IEEE
Continuous circuit miniaturization and increased process variability point to a future with diminishing returns from dynamic voltage scaling. Operation below Vcc-min has been prop...
MTDT
2003
IEEE
14 years 26 days ago
2003
IEEE
Abstract: The high complexity of the faulty behavior observed in DRAMs is caused primarily by the presence of internal floating nodes in defective DRAMs. This paper describes a ne...
KBSE
2009
IEEE
14 years 2 months ago
2009
IEEE
—Automated debugging is becoming increasingly important as the size and complexity of software increases. This paper makes a case for using constraint-based data structure repair...