Abstract— Substantial attention is being paid to the fault diagnosis problem in recent test literature. Yet, the compaction of test vectors for fault diagnosis is little explored...
Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahas...
— We have entered an era where chip yields are decreasing with scaling. A new concept called intelligible testing has been previously proposed with the goal of reversing this tre...
: In parity preserving reversible circuit, the parity of the input vector must match the parity of the output vector. It renders a wide class of circuit faults readily detectable a...
Md. Saiful Islam 0003, Muhammad Mahbubur Rahman, Z...
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
Jacob D. Biamonte, Jeff S. Allen, Marek A. Perkows...
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...