— Achieving reliability in fault tolerant systems requires both avoidance and redundancy. This study focuses on avoidance as it pertains to the design of microchips. The lifecycl...
Continuous circuit miniaturization and increased process variability point to a future with diminishing returns from dynamic voltage scaling. Operation below Vcc-min has been prop...
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
Retiming has been proposed as an optimizationstep forsequential circuits represented at the net-list level. Retiming moves the latches across the logic gates and in doing so chang...
Vigyan Singhal, Carl Pixley, Richard L. Rudell, Ro...