259 search results - page 50 / 52 » Fault Tolerance for Manufacturing Components |
GI
2004
Springer
14 years 23 days ago
2004
Springer
: The transition from microelectronics to nanoelectronics reaches physical limits and results in a paradigm shift in the design and fabrication of electronic circuits. The conserva...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
SAC
2010
ACM
14 years 2 months ago
2010
ACM
Byzantine consensus in asynchronous message-passing systems has been shown to require at least 3f + 1 processes to be solvable in several system models (e.g., with failure detecto...
SC
2009
ACM
14 years 2 months ago
2009
ACM
MapReduce provides a parallel and scalable programming model for data-intensive business and scientific applications. MapReduce and its de facto open source project, called Hadoop...
HPDC
2007
IEEE
14 years 1 months ago
2007
IEEE
Although WSRF (Web Services Resource Framework) and Java-based hosting environment have been successful in dealing with the heterogeneity of resources and the diversity of applica...