259 search results - page 50 / 52 » Fault Tolerance for Manufacturing Components |
141
Voted
GI
2004
Springer
15 years 9 months ago
2004
Springer
: The transition from microelectronics to nanoelectronics reaches physical limits and results in a paradigm shift in the design and fabrication of electronic circuits. The conserva...
126
Voted
DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
136
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SAC
2010
ACM
15 years 10 months ago
2010
ACM
Byzantine consensus in asynchronous message-passing systems has been shown to require at least 3f + 1 processes to be solvable in several system models (e.g., with failure detecto...
156
click to vote
SC
2009
ACM
15 years 10 months ago
2009
ACM
MapReduce provides a parallel and scalable programming model for data-intensive business and scientific applications. MapReduce and its de facto open source project, called Hadoop...
122
Voted
HPDC
2007
IEEE
15 years 9 months ago
2007
IEEE
Although WSRF (Web Services Resource Framework) and Java-based hosting environment have been successful in dealing with the heterogeneity of resources and the diversity of applica...