13 search results - page 2 / 3 » Fault diagnosis in scan-based BIST using both time and space... |
VTS
1999
IEEE
13 years 12 months ago
1999
IEEE
This paper presents adaptive techniques for improving delay fault diagnosis. These techniques reduce the search space for direct probing which can save a lot of time during failur...
GLVLSI
2005
IEEE
14 years 1 months ago
2005
IEEE
As timing requirements in today’s advanced VLSI designs become more aggressive, the need for automated tools to diagnose timing failures increases. This work presents two such a...
WADS
2007
Springer
14 years 1 months ago
2007
Springer
In the faulty-memory RAM model, the content of memory cells can get corrupted at any time during the execution of an algorithm, and a constant number of uncorruptible registers are...
KDD
2004
ACM
14 years 8 months ago
2004
ACM
Moments before the launch of every space vehicle, engineering discipline specialists must make a critical go/no-go decision. The cost of a false positive, allowing a launch in spi...
COMPSAC
2010
IEEE
13 years 5 months ago
2010
IEEE
In distributed IT systems, replication of information is commonly used to strengthen the fault tolerance on a technical level or the autonomy of an organization on a business level...