372 search results - page 47 / 75 » Fault simulation on reconfigurable hardware |
VTS
1997
IEEE
14 years 1 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Failure analysis (FA) and diagnosis of memory cores plays a key role in system-on-chip (SOC) product development and yield ramp-up. Conventional FA based on bitmaps and the experi...
ATS
2004
IEEE
14 years 27 days ago
2004
IEEE
Logical reversibility occurs in low-power applications and is an essential feature of quantum circuits. Of special interest are reversible circuits constructed from a class of rev...
ARC
2007
Springer
13 years 9 months ago
2007
Springer
: The parity space approach to fault detection and isolation (FDI) has been developed during the last twenty years, and the focus here is to describe its application to stochastic ...
ECBS
2011
IEEE
12 years 9 months ago
2011
IEEE
Abstract—Software systems are typically large and exhaustive testing of all possible input parameters is usually not feasible. Testers select tests that they anticipate may catch...