277 search results - page 37 / 56 » Fault tolerance using group communication |
DAC
2011
ACM
12 years 7 months ago
2011
ACM
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
MOBICOM
2004
ACM
14 years 29 days ago
2004
ACM
Topology control algorithms usually reduce the number of links in a wireless network, which in turn decreases the degree of connectivity. The resulting network topology is more su...
SP
2002
IEEE
13 years 7 months ago
2002
IEEE
CX, a network-based computational exchange, is presented. The system's design integrates variations of ideas from other researchers, such as work stealing, non-blocking tasks...
CCGRID
2008
IEEE
14 years 2 months ago
2008
IEEE
— Diffusion Tensor Imaging (DTI) provides insight into the white matter of the human brain, which is affected by Schizophrenia. By comparing a patient group to a control group, t...
STORAGESS
2006
ACM
14 years 1 months ago
2006
ACM
Batch-correlated failures result from the manifestation of a common defect in most, if not all, disk drives belonging to the same production batch. They are much less frequent tha...