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» Fault tolerant methods for reliability in FPGAs
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GLVLSI
2003
IEEE
161views VLSI» more  GLVLSI 2003»
14 years 1 months ago
TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits
The characterization as well as the control of the electromagnetic emission of integrated circuits is an important step in the design process of state of the art integrated circui...
Timm Ostermann, Bernd Deutschmann
ICCD
2003
IEEE
113views Hardware» more  ICCD 2003»
14 years 5 months ago
Exploiting Microarchitectural Redundancy For Defect Tolerance
Continued advancements in fabrication technology and reductions in feature size create challenges in maintaining both manufacturing yield rates and long-term reliability of device...
Premkishore Shivakumar, Stephen W. Keckler, Charle...
EDCC
1994
Springer
14 years 19 days ago
Designing Secure and Reliable Applications using Fragmentation-Redundancy-Scattering: An Object-Oriented Approach
Security and reliability issues in distributed systems have been investigated for several years at LAAS using a technique called Fragmentation-Redundancy-Scattering (FRS). The aim ...
Jean-Charles Fabre, Yves Deswarte, Brian Randell
SIAMCOMP
2002
90views more  SIAMCOMP 2002»
13 years 8 months ago
A Virtually Synchronous Group Multicast Algorithm for WANs: Formal Approach
This paper presents a formal design for a novel group communication service targeted for WANs. The service provides Virtual Synchrony semantics. Such semantics facilitate the desi...
Idit Keidar, Roger Khazan
ICDCS
2011
IEEE
12 years 8 months ago
Smart Redundancy for Distributed Computation
Many distributed software systems allow participation by large numbers of untrusted, potentially faulty components on an open network. As faults are inevitable in this setting, th...
Yuriy Brun, George Edwards, Jae Young Bang, Nenad ...