376 search results - page 14 / 76 » Feedback-Directed Random Test Generation |
VLSID
2005
IEEE
14 years 1 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
DATE
1999
IEEE
14 years 3 days ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
EOR
2010
13 years 5 months ago
2010
: We describe a method to find low cost shift schedules with a time-varying service level that is always above a specified minimum. Most previous approaches used a two-step procedu...
ICST
2008
IEEE
14 years 2 months ago
2008
IEEE
Intuition suggests that random testing of object-oriented programs should exhibit a high difference in the number of defects detected by two different runs over the same amount of...
IFIP
2001
Springer
14 years 7 days ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...